关键词: NOR型FLASH, DSIO

Abstract: Flash memory of NOR type because of the characteristics which can keep data for a long time（non-volatile）, is widely used as storage medium for all kinds of portable digital equipment, but because this type of device programming and erasing are required to write specific instructions, to start the built-in program/Erase algorithm, which makes the automatic test system test it very difficultly, therefore, research to testing technology for Flash memory of NOR type, and the developing test platform of such devices,are both very important. In the paper, taking AM29LV160DT（AMD, Inc.）as an example,we first introduce its basic working principle, and then expatiate detailedly on the method of generating test vector dynamically used by the DSIO module of J750EX system.Thus we can evaluate the function of Flash memory of NOR type more conveniently and efficiently.

Key words: NOR type FLASH, DSIO