中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2016, Vol. 16 ›› Issue (6): 39 -42.

• 微电子制造与可靠性 • 上一篇    下一篇

元器件二次筛选过程中的质量控制

王小萍   

  1. 中国电子科技集团公司第55研究所,南京210016
  • 收稿日期:2016-03-09 出版日期:2016-06-20 发布日期:2016-06-20
  • 作者简介:王小萍(1975-),女,江苏泰州人,工程师,工作于中国电子科技集团公司第55研究所,多年来一直从事电子元器件二次筛选工作.

Electronic Components Quality Control During Secondary Screening Process

WANG Xiaoping   

  1. China Electronics Technology Group Corporation No.55 Research Institute,Nanjing 210016,China
  • Received:2016-03-09 Online:2016-06-20 Published:2016-06-20

摘要: 元器件二次筛选的目的是在于通过对产品实施非破坏性筛选试验,剔除具有潜在缺陷的早期失效产品,为整机的可靠性提供重要保证.为了获得良好的筛选效果,需要选择有效的筛选项目和方法.电容器和分立器件由于结构材料特殊,应用广泛,也容易在二筛过程中造成误判或由于操作不当引入新的失效或隐患,二次筛选过程中的质量控制尤为重要.选择电容器和分立器件,从筛选中最为重要的测试和电老炼两个方面着手,结合静电防护,对二筛过程的质量控制进行阐述.

关键词: 二次筛选;静电防护;测试;电老化

Abstract: The purpose of the secondary screening is to eliminate the early failure products with potential defects through non-destructive screening test and to guarantee the reliability of the whole machine.In order to achieve a good screening effect,effective screening items and methods are very important.Capacitor and discrete components may easily introduce defects or cause failure in the process of secondary screening due to improper operation.The quality control of capacitor and discrete components in secondary screening process is particularly important.The article highlights the two typical tests during the secondary screening to give detailed explanation of the quality control for secondary screening.

Key words: secondary screening, electrostatic protection, test, electrical aging

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