中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (7): 070205 . doi: 10.16257/j.cnki.1681-1070.2021.0716

• 封装、组装与测试 • 上一篇    下一篇

低温共烧陶瓷多层基板界面缺陷与抑制

王岩;王多笑;董兆文;沐方清   

  1. 中国电子科技集团公司第四十三研究所 微系统安徽省重点实验室,合肥 230088
  • 收稿日期:2021-03-03 出版日期:2021-07-22 发布日期:2021-06-24
  • 作者简介:王岩(1964—),男,安徽合肥人,博士,主要研究方向为LTCC材料和工艺以及混合集成电路和微系统封装。

Interfacial Defects and Suppression of Low TemperatureCo-fired Ceramic Multilayer Substrate

WANG Yan, WANG Duoxiao, DONG Zhaowen, MU Fangqing   

  1. Anhui Province Key Laboratory of Microsystem, the 43rd Research Institute of CETC,
  • Received:2021-03-03 Online:2021-07-22 Published:2021-06-24

摘要: 带有空腔和金属通孔的低温共烧陶瓷多层基板是一种异质材料体系,基板内存在多个界面。基板的空腔界面和金属通孔的层间界面是两种典型界面。针对基板的空腔界面和金属通孔的层间界面在基板制造过程中分别出现的微裂纹和微空洞问题进行了研究。通过有限元仿真分析和破坏性物理分析分别对空腔界面微裂纹、金属通孔层间界面微空洞的形成原因进行了探讨,并有针对性地采取工艺改进措施。结果表明,通过工艺改进,可以较好地抑制界面微裂纹和层间微空洞缺陷。

关键词: 共烧陶瓷基板, 界面, 微裂纹, 微空洞

Abstract: The low temperature co-fired ceramic multilayer substrate with cavities and metal through holes is a heterogeneous material system, and there are multiple interfaces in the substrate. The substrate cavity interface and the metal via layer interface are two typical interfaces. The problems of micro-cracks and micro-cavities appeared in the substrate cavity interface and the interface between metal via layers respectively in the substrate manufacturing process are studied. Through finite element simulation analysis and destructive physical analysis, the reasons for the formation of micro-cracks in the cavity interface and micro-voids in the interface between metal vias are discussed, and targeted process improvement measures are taken. The results show that through process improvement, interface micro-cracks and interlayer micro-void defects can be better suppressed.

Key words: co-firedceramicsubstrate, interface, micro-crack, micro-void

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