关键词: ∶CMOS器件;长期贮存;试验方法;数据处理

Abstract: The article introduces a new test method that it can evaluate the long storage life of the CMOS component in short time.Room temperature storage test and high temperature test are performed using the samples of CMOS component, respectively.The room temperature storage test is used to accumulate the data to analyze the changes of the CMOS long storage performance.And the high temperature storage test is used to accelerate the process.Periodic tests are performed during the experiment.By comparing the data and using Arrhenius relationship,the long storage life of CMOS component can be evaluated in short time.

Key words: CMOS component, long storage, test method, data processing