关键词: 并行修调, 高效, 多工位

Abstract: This paper presents a high efficiency scheme for multi-site test in wafer testing.Compared to the traditional serial trimming,parallel trimming plan significantly reduces the time,and the average efficiency increase is between 30%-50%.According to the characteristics of the product,the more the number of fuses required to fuse,the more the number of sites,the efficiency improvement of parallel trimming plan is more obvious.Parallel trimming plan is feasible,reliable,stable and efficient.What's more,it can replace the traditionalserialtrimming plan,save production costs and enhance the competitiveness ofthe industry.

Key words: paralleltrimming plan, high efficiency, multi-site