关键词: 单粒子翻转, FPGA, 刷新控制电路, 辐照试验

Abstract: SRAM field programmable gate array (FPGA) is widely used in spacecraft because of its powerful signal processing performance. However, the logic unit of SRAM FPGA is prone to unit flip in the space environment where a large number of cosmic rays and high-energy particles are present, resulting in abnormal logic function of the device. Continuously refreshing the logic function of FPGA by refresh control circuit is a common method to solve the unit flip problem nowadays. In order to meet the system requirements of anti-single particle flip, the anti-single particle flip performance of FPGA refresh control circuit itself needs to be fully verified by certain test methods. An irradiation test method is designed to test the FPGA refresh control circuit, and the anti-single particle flip performance of the circuit is verified by the irradiation test method.

Key words: single particle flip, FPGA, refresh control circuit, irradiation test