中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2024, Vol. 24 ›› Issue (11): 110202 . doi: 10.16257/j.cnki.1681-1070.2024.0157

• 封装、组装与测试 • 上一篇    下一篇

抗辐照电源监控电路的极限评估试验研究

文科,文闻,钟昂,余航,罗俊   

  1. 中国电子科技集团公司第二十四研究所,重庆? 400060
  • 收稿日期:2024-05-14 出版日期:2024-11-25 发布日期:2024-11-25
  • 作者简介:文科(1987—),男,重庆人,硕士,高级工程师,主要研究方向为微电子集成电路可靠性及测试技术。

Experimental Study on Limit Evaluation of Anti-Irradiation Power Supply Monitoring Circuit

WEN Ke, WEN Wen, ZHONG Ang, YU Hang, LUO Jun   

  1. China Electronics Technology Group Corporation No.24 Research Institute, Chongqing 400060, China
  • Received:2024-05-14 Online:2024-11-25 Published:2024-11-25

摘要: 基于国内某款抗辐照电源监控电路开展了极限评估研究,分析该款产品的详细规范、核心参数、极限判据等内容。通过设计步进应力试验、寿命试验、辐照试验等,评估电路在电、热、机械等应力下的极限能力和失效模式,并对极限评估的方案有效性进行了验证。试验结果表明,设计的极限评估方案能够有效反映器件在各种极限条件下的性能,通过试验可以查出器件的设计薄弱环节和失效模式,为器件在设计、工艺以及材料方面的优化提供支撑。

关键词: 极限评估, 电源监控, 失效模式

Abstract: The limit evaluation research is carried out based on a domestic anti-irradiation power supply monitoring circuit. The detailed specifications, core parameters and limit criteria of this product are analyzed. The ultimate capability and failure mode of the circuit under electrical, thermal and mechanical stresses are evaluated by designing the step stress test, life test and irradiation test, and the effectiveness of the limit evaluation scheme is verified. The test results show that the designed limit evaluation scheme can effectively reflect the performance of device under various limit conditions, the design weakness and failure mode of the device can be identified through the test, which provides support for the optimization of the device in design, process and material.

Key words: limit evaluation, power monitoring, failure mode

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