[1] WU L S, MAO J F. From integrated circuits to integrated systems[J]. Scientia Sinica Informationis, 2023, 53(10): 1843-1857. [2] RANNO L, GUPTA P, GRADKOWSKI K, et al. Integrated photonics packaging: Challenges and opportunities[J]. ACS Photonics, 2022, 9(11): 3467-3485. [3] EECKHOUT L. Is Moore’s Law slowing down? what’s next?[J]. IEEE Micro, 2017, 37(4): 4-5. [4] TRACK E, FORBES N, STRAWN G. The end of Moore’s Law[J]. Computing in Science & Engineering, 2017, 19(2): 4-6. [5] SHALF J. The future of computing beyond Moore’s Law[J]. Philosophical Transactions of the Royal Society A: Mathematical, Physical, and Engineering Sciences, 2020, 378(2166): 1-15. [6] YAO X, XIAO Z Q, MING X F, et al. Warpage analysis of high-density FC-PBGA device during package process[C]//2018 19th International Conference on Electronic Packaging Technology (ICEPT), Shanghai, 2018. [7] CUI R B, KUANG Z L, YANG G N, et al. Warpage simulation and optimization of panel level fan-out embedded package[C]//2020 21st International Conference on Electronic Packaging Technology (ICEPT), Guangzhou, 2020. [8] YANG G N, LAI H Q, LIN W, et al. A quantitative model to understand the microflow-controlled sintering mechanism of metal particles at nanometer to micron scale[J]. Nanotechnology, 2021, 32(50): 505721. [9] LEE C C, LEE C C, CHANG C P. Simulation methodology development of warpage estimation for epoxy molding compound under considerations of stress relaxation characteristics and curing conditions applied in semiconductor packaging[J]. Materials Science in Semiconductor Processing, 2022, 145: 106637. [10] CHEN C, YU D Q, WANG T, et al. Warpage prediction and optimization for embedded silicon fan-out wafer-level packaging based on an extended theoretical model[J]. IEEE Transactions on Components, Packaging and Manufacturing Technology, 2019, 9(5): 845-853. [11] CHEN D L, HU I, CHEN K Y, et al. Material and structure design optimization for panel-level fan-out packaging[C]//2019 IEEE 69th Electronic Components and Technology Conference (ECTC), Las Vegas, 2019. [12] FOWLER M, MASSEY J P, BRAUN T, et al. Investigation and methods using various release and thermoplastic bonding materials to reduce die shift and wafer warpage for eWLB chip-first processes[C]//2019 IEEE 69th Electronic Components and Technology Conference (ECTC), Las Vegas, 2019. [13] LI H, CHENG G, XU G W, et al. Explore of warpage origination in WLP and processing influence factors by experiment and theoretical modeling[J]. Journal of Materials Science: Materials in Electronics, 2016, 27(11): 11548-11555. [14] CHUNG P W K, YUEN M M F, CHAN P C H, et al. Effect of copper oxide on the adhesion behavior of Epoxy Molding Compound-copper interface[C]//52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345), San Diego, 2002. [15] 匡自亮. 扇出型板级封装热应力翘曲分析与改善[D]. 广州: 广东工业大学, 2021. [16] HE Y M, ZHU X S, CHEN W J, et al. An ultra-high bond strength of the Cf/C composite-TC4 alloy joint brazed using pure Ni and revealing of synergetic action of multiple stress-relief mechanisms[J]. Materials Letters, 2022, 308: 131245. [17] HUANG C Y, YING K C. Applying strain gauges to measuring thermal warpage of printed circuit boards[J]. Measurement, 2017, 110: 239-248.
|