关键词: STM32F429, AD静态参数, 自动测试系统

Abstract: The AD module integrated inside the MCU is commonly used in various solutions. The INL and DNL in the AD static parameters are important indicators for evaluating AD performance. For the testing of INL and DNL parameters, the cost of using professional instruments to test is too high, and the user's demand for economical and accurate test benches has become increasingly significant. Low-cost AD static parameter automatic test system design is provided. The basic realization principle of the test system is explained firstly, and then make a detailed introduction from the two parts of the hardware system and the software system. Practical use proves that the test system is suitable for the INL and DNL parameter testing of the AD module of the MCU, with stable work, accurate testing and low cost.

Key words: STM32F429, ADstaticparameter, automatictestsystem