关键词: 测试机, 传输延时, 可数据化, 可量产

Abstract: With the rapid development of integrated circuits, users have higher and higher requirements for circuit performance. The traditional method of evaluation to obtain the AC parameters of circuits is very limited in the number of circuits that can be evaluated and is not convenient for testing at high and low temperature. When the test machine is used to test the circuit propagation delay parameter, it only judges whether the parameter meets the requirement by running the test code and setting the threshold. Aiming at the traditional test defects, this paper presents a method to measure the propagation delay parameters by using V50 (an digital-analog hybrid testing machine), introduces the preparation of software and hardware, specific operation methods, test points, etc., and provides a measurable, data-ready and mass-produced solution.

Key words: ICtestmachine, propagationdelay, data-ready, mass-produced