N多晶电阻的温度漂移影响因子及工艺研究
陈培仓,周凌霄,洪成强,王涛,吴建伟
N Polycrystalline Resistor Temperature Drift Influence Factor and Process Research
CHEN Peicang, ZHOU Lingxiao, HONG Chengqiang, WANG Tao, WU Jianwei
电子与封装
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2024, (5): 50403
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DOI: 10.16257/j.cnki.1681-1070.2024.0070
