芯粒互连测试向量生成与测试方法研究

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解维坤, 李羽晴, 殷誉嘉, 王厚军

Research on Vector Generation and Testing Method for Chiplet Interconnection Testing

XIE Weikun, LI Yuqing, YIN Yujia, WANG Houjun

电子与封装 . 2024, (11): 110103 . DOI: 10.16257/j.cnki.1681-1070.2024.0175