抗辐射高压SOI埋氧总剂量效应研究

导航

徐海铭，洪根深，吴建伟，徐政，刘国柱

Investigation of the Total Ionizing Dose Effects in SOI High Voltage Devices

XU Haiming,HONG Genshen,WU Jianwei,XU Zheng,LIU Guozhu

电子与封装 . 2019, (1): 41 -43 . DOI: 10.16257/j.cnki.1681-1070.2019.0010