基于J750EX测试系统的大容量NOR型FLASH测试方法
季伟伟，倪晓东，张凯虹，杜元勋
The Investigation of the Testing Method for the High-capacity FLASH of NOR Type Based on the J750EX Measur-ing System
JI Weiwei, NI Xiaodong, ZHANG Kaihong, DU Yuanxun
电子与封装
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2017, (9): 10
-14
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DOI: 10.16257/j.cnki.1681-1070.2017.0106
