电子与封装 ›› 2018, Vol. 18 ›› Issue (12): 8 -11. doi: 10.16257/j.cnki.1681-1070.2018.0129
• 封装、组装与测试 • 上一篇 下一篇
李青松1,罗向阳1,王瑞崧1,潘凌宇1,张 吉1,雷 鸣2,郑 丹2
收稿日期:
出版日期:
发布日期:
作者简介:
LI Qingsong1,LUO Xiangyang1,WANG Ruisong1,PAN Lingyu1,ZHANG Ji1,LEI Ming2,ZHENG Dan2
Received:
Online:
Published:
摘要: 超声扫描检测技术应用越来越广泛,在半导体器件、材料和生物医学等领域均利用了超声扫描技术。对超声扫描检测技术在塑封微电路中的应用进行了简要介绍,指出了超声扫描检测技术存在的一些局限性,并提出了一些检测改进建议。
关键词: 超声扫描, 塑封微电路, 局限性
Abstract: With the application of C-SAM becoming more and more widely,C-SAM is used in semiconductor,material and Biomedical.The paper gave the limitations of ultrasonic scanning detection in PEMs.And some suggestions were proposed as a reference.
Key words: C-SAM, PEMs, limitations
中图分类号:
TN305.94
李青松1,罗向阳1,王瑞崧1,潘凌宇1,张 吉1,雷 鸣2,郑 丹2. 塑封微电路超声扫描检测的局限性[J]. 电子与封装, 2018, 18(12): 8 -11.
LI Qingsong1,LUO Xiangyang1,WANG Ruisong1,PAN Lingyu1,ZHANG Ji1,LEI Ming2,ZHENG Dan2. Limitations of Ultrasonic Scanning Detection in PEMs[J]. Electronics & Packaging, 2018, 18(12): 8 -11.
0 / / 推荐
导出引用管理器 EndNote|Reference Manager|ProCite|BibTeX|RefWorks
链接本文: https://ep.org.cn/CN/10.16257/j.cnki.1681-1070.2018.0129
https://ep.org.cn/CN/Y2018/V18/I12/8