关键词: 塑封器件, 缺陷判断, 材料吸湿

Abstract: Serial peripheral interface(SPI) is a synchronous serial interface which is widely used in communication. Due to inevitability of high Acoustic scanning microscope is an important equipment for plastic encapsulated microcircuit(PEM) on testing the internal cracks, voids and delaminations. In practical work, the testing results will be different, because of the marginal influence such as the material absorption humidity, equipment set status or different defects criterion etc. The principle of the acoustic scanning technology, proper standard and defects criterion are stated. The influence from the different equipment status and material absorption humidity are analyzed. The unqualified and inconsistent reasons in the testing of the PEM, so as to get the more reliable and more precise result on the judging the delamination defects of the PEM are summarized for your reference.

Key words: plastic encapsulated microcircuit, defects criterion, material absorption humidity