中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (11): 110202 . doi: 10.16257/j.cnki.1681-1070.2021.1103

• 封装、组装与测试 • 上一篇    下一篇

一种CPU芯片功能自动测试平台的设计

侯庆庆1;刘凯2;李文学1   

  1. 1.中科芯集成电路有限公司,江苏 无锡 214072;2.中电科申泰信息科技有限公司,江苏 无锡 214063
  • 收稿日期:2021-02-24 出版日期:2021-11-24 发布日期:2021-04-28
  • 作者简介:侯庆庆(1988—),男,安徽宿州人,硕士,工程师,现从事硬件设计和电路测试等相关工作。

Design ofAutomatic Test Platform for CPU Chip Functions

HOU Qingqing1, LIU Kai2, LI Wenxue1   

  1. 1.China Key System & Integrated CircuitCo., Ltd., Wuxi 214072, China;
  • Received:2021-02-24 Online:2021-11-24 Published:2021-04-28

摘要: 针对CPU芯片的复杂性,芯片的自动化测试可节约测试时间,提高测试的准确度。设计了一种CPU芯片功能自动测试平台,该测试平台由待测CPU芯片、主控芯片和FPGA组成,主控芯片实现对待测电路的功能测试,FPGA负责协助处理,测试平台可实现CPU芯片的自动测试,测试结果通过串口输出表格化信息,便于观察测试结果与故障判断,弥补了测试机的不足。验证结果表明,该测试平台操作方便,可实现对复杂CPU的自动化测试,提高产品的测试效率。

关键词: 测试平台, 自动化测试, CPU芯片

Abstract: For the complexity of the CPU chip, chip testing automated testing can save time, and improve accuracy of the test. An automatic test platform for CPU chip functions is designed. The test platform is composed of CPU chip, control chip and FPGA. The control chip realizes the function test of the circuit to be tested, and FPGA is responsible for assisting processing. The test platform can realize the automatic test for the CPU chip. The test results are output in tabular information through the serial port, which is convenient for observing the test results and fault judgment, and makes up for the lack of the test machine. The verification results show that the test platform is easy to operate, can realize automated testing of complex CPUs, and improve product testing efficiency.

Key words: testplatform, automatedtesting, CPUchip

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