关键词: 微控制单元, ATE测试系统, 功能测试, 修调测试, ADC测试

Abstract: With the advantage characteristics of high performances, complex function, programmable and low power, microcontroller unit (MCU) chips are widely used in signal processing and embedded systems. On-line mass production testing is the most important quality assurance technique, how to achieve high performance and efficient testing of complex functions is the difficulty of online testing of MCU chips. The on-line testing techniques of 32 bit MCU chip are developed based on J750Ex-HD IC ATE testing equipment. The functional test methods of MCU modules, such as POR/PDR, GPIO, ADC, trimming and memory are presented. According to the testing flow of MCU, the ATE testing loadboard and socket are designed, the on-line testing programs are developed based on VBT, which realize the on-line testing of batch MCU chips.

Key words: MCU, ATEtestsystem, functiontest, trimmingtest, ADCtest