中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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• 封装、组装与测试 •    下一篇

VCD和WGL文件转换为ATE测试向量的方法

欧阳涛1,谭勋琼1,李振涛1,2   

  1. 1. 长沙理工大学物理与电子科学学院,长沙  410000;2. 湖南毂梁微电子有限公司,长沙  410000
  • 收稿日期:2024-12-13 修回日期:2025-01-24 出版日期:2025-02-12 发布日期:2025-02-12
  • 通讯作者: 谭勋琼

Method for Converting VCD and WGL Files into ATE Test Vectors

OUYANG Tao1, Tan Xunqiong1, LI Zhentao1,2   

  1. 1. School of Physics and Electronic Science, Changsha University of Science and Technology, Changsha 432000, China; 2. Hunan Guliang Microelectronics Co., Ltd., Changsha 432000, China
  • Received:2024-12-13 Revised:2025-01-24 Online:2025-02-12 Published:2025-02-12

摘要: 介绍了VCD(Value Change Dump)和WGL(Waveform Generation Language)波形描述文件在集成电路领域的重要应用,并对VCD和WGL文件中的组成元素进行了全面的分析。结合波形文件特点,采用逐行解析匹配关键字的策略对文件进行解析,引入配置文件控制数据处理过程,将波形文件转换为自动测试机台(ATE)所需的测试向量。最终在Linux环境下采用C/C++语言实现。实际应用表明,该方法转换过程简便高效,在保证测试向量功能正常的条件下,VCD文件和WGL文件的转换时间都有明显缩减,达到了提高转换效率的目的。

关键词: 仿真波形文件, 自动测试机台, 测试向量, 集成电路测试

Abstract: The introduction elaborates on the important applications of VCD (Value Change Dump) and WGL (Waveform Generation Language) waveform description files in the field of integrated circuits. It provides a comprehensive analysis of the elements in VCD and WGL files. By considering the characteristics of waveform files, a strategy of parsing files line by line and matching keywords is adopted. A configuration file is introduced to control the data processing process, converting waveform files into the test vectors required by ATE (Automatic Test Equipment). Finally, the implementation is achieved in a Linux environment using C/C++ languages. Practical applications have shown that this method simplifies and enhances the conversion process, significantly reducing the conversion time of VCD and WGL files while ensuring the normal functioning of test vectors, thus achieving the goal of improving conversion efficiency.

Key words: simulation waveform files, automatic test equipment, test vector, integrated circuit testing