关键词: 系统级封装, 旋变解码器, 旋变信号, 驱动器, 批量测试

Abstract: The integrated packaging of the resolver decoder and driver in system-in-package (SiP) technology meets the need for smaller and more integrated control circuits in modern space vehicles. In order to perform multi-process batch screening tests on this SiP product, MATLAB is used to generate sine-cosine waveform data, which is imported into the J750 test system to achieve free control of signal generation and stopping. Design the corresponding peripheral circuits to multiply the sine-cosine signal with the excitation signal, which can simulate the output of a resolver, and this output is used as the input of a resolver decoder. Based on the J750, the resolver decoder is made to work properly according to the corresponding control timing, and its angle and speed accuracy can be tested. The test circuit of this driver is designed on the same adapter to test its driving ability and other key parameters. The test results show that this test scheme can efficiently and automatically achieve the integration test of the resolver decoder and driver, which meets the large-scale batch test requirements in actual production.

Key words: system-in-package, resolver decoder, resolver signal, driver, batch testing