关键词: 特征曲线, 失效分析, 缺陷

Abstract: In order to quickly and accurate define leakage failure mode and failure mechanism in semiconductor backend assembly factory,we introduce leakage current characteristic curve analysis method,this method through experimental analysis lager samples leakage failure cases,comparison and analysis current leakage characteristic curve and compare with failure mode,work out the leakage current characteristic curves method,fast and accurate screen out reliability risk products and no reliability risk products.This method have already implemented in the backend assembly factory,greatly improved efficiency and accuracy,improved the productquality,save cost,hasreached the customer expectationsofquality and cost.

Key words: leakage currentcharacteristic curve, failure analysis, defect