中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2018, Vol. 18 ›› Issue (7): 7 -11. doi: 10.16257/j.cnki.1681-1070.2018.0072

• 封装、组装与测试 • 上一篇    下一篇

深入理解光学检漏:漏率计算及其他

葛秋玲,肖汉武   

  1. 无锡中微高科电子有限公司,江苏 无锡 214035
  • 出版日期:2018-07-20 发布日期:2020-02-21
  • 作者简介:葛秋玲(1966—),女,江苏南京人,现在中国电子科技集团公司第58研究所从事封装工艺工作。

Deep Understanding of Optical Leak Testing Technology:Leak Rate Calculation and the Others

GE Qiuling, XIAO Hanwu   

  1. Wuxi ZhongWei High-tech Electronics Co., Ltd.,Wuxi 214035, China
  • Online:2018-07-20 Published:2020-02-21

摘要: 光学检漏OLT借助先进的数字电子全息照相干涉测量技术,可实现同步完成传统气密封装的细检漏、粗检漏过程的一项新型检漏技术。重点介绍了光学检漏漏率计算公式的推导过程,并对光学检漏测量数据的准确性、光学检漏方法的优缺点等进行了比较和讨论。

关键词: 光学检漏, 气密性, 漏率计算公式

Abstract: Optical Leak Testing (OLT) is a new technology for leak testing in recent years due to its advanced digital microelectronic holography interferometry , that could accomplished simultaneous fine and gross leak testing of traditional hermetic packages. This paper introduces the derivation process of leak rate calculation formulas of OLT, the accuracy of testing data and the pros and cons of OLT are also compared and discussed .

Key words: optical leak testing, hermeticity, leak rate calculation formulas

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