关键词: 单粒子瞬态脉冲, 抗辐射加固, 触发器, 三模冗余

Abstract: With the development of semiconductor technology and the shrinking of the process size, the single-event effects on digital integrated circuits used in space become more and more obvious. Especially when the working frequency is high, single-event transient on the circuit is very serious, and may even cause failure of the circuit function. This paper introduces an improve design of TMR (Triple Modular Redundancy) flip-flop with self-refresh. The ability to withstand single-event transient of the original flip-flop design is improved. This work supplies a good technologic base for design of radiation hardened digital logic in the future.

Key words: single-event transient, radiation hardness, flip-flop, triple modular redundancy