中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2020, Vol. 20 ›› Issue (5): 050401 . doi: 10.16257/j.cnki.1681-1070.2020.0511

• 微电子制造与可靠性 • 上一篇    下一篇

一种具有Butfer层的分离栅VDM0S研兖

何俊卿,乔明,任敏   

  1. 电子科技大学,成都 610054
  • 出版日期:2020-05-25 发布日期:2020-05-25
  • 作者简介:何俊卿(1995—),男,福建福清人,电子科技大学电子科学与工程学院硕士在读,主要从事高低压功率器件等方面的研究。

Research on the Split-Gate VDMOS with Buffer Layer

HE Junqing, QIAO Ming, REN Min   

  1. University of Electronic Science and Technology of China, Chengdu 610054, China
  • Online:2020-05-25 Published:2020-05-25

摘要: 介绍了一种具有Buffer层的分离栅VDMOS器件,通过Medici进行了仿真研究,分析了Buffer层对器件电学特性的影响,并提供了获得合适Buffer层参数以优化器件功率优值的设计公式。优化后器件的功率优值较现有研究结果均出现了30%以上的增加。

关键词: Buffer层;分离栅VDMOS;Medici;功率优值

Abstract: A split-gate VDMOS with a buffer layer is introduced. The influence of the buffer layer on the device is analyzed by simulations with Medici, and a design formula for obtaining the appropriate buffer layer parameters to optimize the device power figure of merit is provided. After optimization, the power figure of merit of the device has increased by more than 30% compared with the existing research results.

Key words: Buffer layer; split-gate VDMOS; Medici; power figure of merit

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