多数据传输速率SerDes的测试方法研究*

doi:10.16257/j.cnki.1681-1070.2026.0016

电子与封装 ›› 2026, Vol. 26 ›› Issue (1): 010207 . doi: 10.16257/j.cnki.1681-1070.2026.0016

多数据传输速率SerDes的测试方法研究^*

曹睿，张霞，李智超，王兆辉，侯帅康

信息工程大学，郑州 450001

收稿日期:2025-06-23 出版日期:2026-01-29 发布日期:2025-08-11
作者简介:曹睿（1997—），男，河南商丘人，硕士，主要研究方向为芯片设计与验证、集成电路测试。

Research on Test Methods for Multi-Data-Rate SerDes

CAO Rui, ZHANG Xia, LI Zhichao, WANG Zhaohui, HOU Shuaikang

InformationEngineering University, Zhengzhou 450001, China

Received:2025-06-23 Online:2026-01-29 Published:2025-08-11

摘要/Abstract

摘要： 串行器/解串器（SerDes）参数测试是芯片测试中不可缺少的一部分，但是涉及到多数据传输速率SerDes发送端和接收端测试通常需要分别进行，并且测试环境较为复杂，频繁更改测试环境会导致测试流程冗长且可靠性较低。基于一款多数据传输速率交换芯片的测试需求，构建出一套可以同时进行多数据传输速率SerDes发送端和接收端测试的环境，并且可以在此基础上进行高低温测试，测试流程中环境不需要进行任何更改。测试结果表明，该测试系统可以满足被测芯片SerDes在4.250~53.125 Gbit/s传输速率下发送端、接收端的三温测试，测试方法便利且测试数据真实可靠。

关键词: SerDes测试, 多数据传输速率测试, 高低温测试, 误码率, 眼图

Abstract: Serializer/deserializer (SerDes) parameter test is an indispensable part of chip test. However, testing the transmitter and receiver of a multi-data-rate SerDes generally needs to be carried out separately, and the test environment is relatively complex. Continuously changing the test environment leads to a lengthy test process and reliability reduction. Based on the test requirements of a multi-data-rate switching chip, a test setup is developed that enables simultaneous testing of the SerDes transmitter and receiver across multiple data rates. Furthermore, high- and low-temperature testing can be performed using the same setup without any modifications throughout the entire test process. Test results demonstrate that this test system can perform triple testing on the transmitter and receiver ends of SerDes chips with transmission rates ranging from 4.250-53.125 Gbit/s. The test method is convenient, and the test data is authentic and reliable.

Key words: SerDes testing, multi-data-rate testing, high- and low-temperature testing, bit error rate, eye diagram

中图分类号:

TN407

曹睿，张霞，李智超，王兆辉，侯帅康. 多数据传输速率SerDes的测试方法研究^*[J]. 电子与封装, 2026, 26(1): 010207 .

CAO Rui, ZHANG Xia, LI Zhichao, WANG Zhaohui, HOU Shuaikang. Research on Test Methods for Multi-Data-Rate SerDes[J]. Electronics & Packaging, 2026, 26(1): 010207 .

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中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

多数据传输速率SerDes的测试方法研究^*

Research on Test Methods for Multi-Data-Rate SerDes

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