关键词: SerDes测试, 多频点测试, 高低温测试, 误码率, 眼图

Abstract: In chip testing, SerDes (Serializer/Deserializer) parameter testing is an indispensable part. However, testing multiple frequency points of SerDes transmitter and receiver generally needs to be carried out separately with a complex environment, and continuously changing the test environment leads to a lengthy process and lower reliability. Based on the testing requirements of a multi-frequency point switching chip, this paper constructs a testing environment that can simultaneously conduct tests on multiple frequency points of SerDes transmitter and receiver. Furthermore, it allows for high and low-temperature testing on this basis without any changes to the environment during the testing process. Practical tests have shown that this testing system can meet the three-temperature testing requirements for all frequency points from 4.25 Gbit/s to 53.125 Gbit/s for the SerDes of the chip under test, providing a convenient testing method with genuine and reliable test data.

Key words: SerDes testing, Multi-frequency point testing, High and low-temperature testing, Bit error rate, Eye diagram