关键词: 晶圆测试, 晶圆可接受度测试, 成测, 数据分析

Abstract: With the rapid development of integrated circuits and the advent of the era of industrial internet of things, the cost of high-performance and high reliability chip manufacturing is getting higher and higher. In order to ensure the high quality of chip production, the test parameters of chip test need to be fully covered, which leads to the long time and high cost of chip test. Therefore, in order to reduce the cost of chip testing, how to scientifically reduce the time and cost of chip testing under the premise of ensuring product quality from the perspective of data analysis is studied. The statistical analysis of the actual test data shows that the proposed method can effectively reduce the time and cost of chip testing.

Key words: wafertest, waferacceptationtest, finaltest, dataanalysis