中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (3): 030303 . doi: 10.16257/j.cnki.1681-1070.2022.0305

• 电路与系统 • 上一篇    下一篇

LED驱动电路中的过零检测技术

朱晓杰;王栋   

  1. 杭州士兰微电子股份有限公司,杭州 310012
  • 收稿日期:2021-06-04 出版日期:2022-03-24 发布日期:2021-09-27
  • 作者简介:朱晓杰(1983—),男,浙江杭州人,工学学士,工程师,现从事电源管理类集成电路设计和开发。

Zero-Crossing Detection Technology in LED Driver

ZHU Xiaojie, WANG Dong   

  1. Hangzhou Silan Microelectronics Co., Ltd., Hangzhou 310013, China
  • Received:2021-06-04 Online:2022-03-24 Published:2021-09-27

摘要: 针对目前采用临界导通模式(Boundary Conduction Mode, BCM)的发光二极管(Light Emitting Diode, LED)驱动电路,介绍了临界导通模式中过零检测的原理,并且针对传统技术中采用源极驱动结构实现过零检测的缺点,提出了一种基于功率MOS管栅极过零检测方式,在实现过零检测功能的基础上,优化了LED驱动控制电路的线路结构,减小了芯片面积,提高了电路的竞争力。

关键词: LED驱动, 临界导通, 过零检测, 栅极驱动, 栅极过零检测

Abstract: The principle of zero-crossing detect in the boundary conduction mode (BCM) in light emitting diode (LED) drive circuit is introduced. Aiming at the shortcoming of the traditional method using source-driven, a zero-crossing detection method based on power MOS gate is proposed. Based on the function of zero-crossing detection, the new method can optimize the circuit structure, reduce the chip area, and improve the competitiveness of the circuit.

Key words: LED driver, boundary conduction, zero-crossing detect, gate-driven, gate zero-crossing detect

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