中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2025, Vol. 25 ›› Issue (1): 010301 . doi: 10.16257/j.cnki.1681-1070.2025.0001

• 电路与系统 • 上一篇    下一篇

适用于STT-MRAM的写电压产生电路设计

莫愁,王艳芳,李嘉威,陆楠楠   

  1. 中国电子科技集团公司第五十八研究所,江苏 无锡 ?214035
  • 收稿日期:2024-07-05 出版日期:2025-01-22 发布日期:2025-01-22
  • 作者简介:莫愁(1996—),女,江苏连云港人,本科,助理工程师,主要从事反熔丝FPGA及MRAM等存储器方向研发工作。

Write Voltage Generation Circuit Design for STT-MRAM

MO Chou, WANG Yanfang, LI Jiawei, LU Nannan   

  1. China Electronics Technology Group Corporation No.58 ResearchInstitute, Wuxi 214035, China
  • Received:2024-07-05 Online:2025-01-22 Published:2025-01-22

摘要: 自旋转移力矩随机磁存储器(STT-MRAM)是一种新型的非易失性存储器,在各行各业均具有广泛的应用前景。STT-MRAM使用磁隧道结(MTJ)器件来存储信息,写电压通常是零温度系数的,但MTJ的临界翻转电压具有负温度特性,高温时写电压与临界翻转电压相差较大,影响器件寿命,低温时写电压与临界翻转电压接近,甚至可能低于临界翻转电压,导致写入困难。针对MTJ的临界翻转电压的负温度特性,设计了一款宽温区温度自适应的写电压产生电路,在-40~125 ℃下为MTJ提供稳定的写电压,实现宽温度范围尤其是低温下数据的正常写入,并提高了高温下器件的寿命。经过后仿真验证,该电路在-40~125 ℃温度范围内均能实现MTJ成功写入,且写入电压与临界翻转电压的差值在100 mV左右。

关键词: 自旋转移力矩随机磁存储器, 磁隧道结, 宽温区, 温度自适应, 写电压产生电路

Abstract: Spin transfer torque magnetic random access memory (STT-MRAM) is a new type of non-volatile memory with a wide range of applications in various industries. STT-MRAM uses magnetic tunnel junction (MTJ) devices to store information. The write voltage usually has zero temperature coefficient, but the critical flip-flop voltage of MTJ has a negative temperature characteristic, so the difference between the write voltage and the critical flip-flop voltage is large at high temperature, which affects the lifetime of the device, and at low temperature, the write voltage is close to, or may even be lower than the critical flip-flop voltage, which makes it difficult to write. Aiming at the negative temperature characteristic of the critical flip-flop voltage of MTJ, a wide temperature adaptive write voltage generator circuit is designed to provide stable write voltage for MTJ at -40-125 ℃, to realize the normal writing of data in wide temperature range, especially at low temperature, and to improve the lifetime of the device at high temperature. After post-simulation verification, the MTJ can be successfully written in the temperature range of -40-125 ℃, and the difference between the write voltage and the critical flip-flop voltage is about 100 mV.

Key words: spin transfer torque magnetic random access memory, magnetic tunnel junction, wide temperature, temperature adaptive, write voltage generation circuit

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