关键词: TMR, I/O, 抗辐照, FPGA

Abstract: A multi-standard I/O circuit is designed for the radiation-tolerant FPGA to meet the requirements of large-scale FPGA devices and high speed data transmission in industrial control, aerospace and other various complex electromagnetic radiation environment. The input/output registers in the I/O circuit are protected against radiation by triple-module redundancy technology, the I/O circuit can support 14 level standards and achieve wide voltage range regulation. The radiation-tolerant FPGA is immune to single-event upsets (SEU) to LETTH >37 MeV?cm2/mg. The simulation and test results show that the I/O circuit meets the design requirements.

Key words: TMR, I/O, radiation-tolerant, FPGA