关键词: 晶圆测试, 测试Map, 重生

Abstract: Chip Probing will generate a test map for each wafer completed. Each test map is the wafer's "ID card" before the wafer is subjected to packaging processes such as grinding, dicing, picking and bonding. ID card processing is usually divided into first application and reissue, etc. The first application is applicable to the routine chip probing process. Replenishment is suitable for secondary and above processing, and its scenarios include but are not limited to the following situations: test data exists, but test map is lost; customer provides electronic map for testing, but the format is not accepted by probe station and so on. The need to reissue the "ID card" of the test map prompted the "rebirth" technology of the test map to emerge.

Key words: chipprobing, testmap, rebirth