中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

导航
玻璃通孔技术的力学可靠性问题及研究进展*
马小菡,董瑞鹏,万欣,贾冯睿,龙旭
Mechanical Reliability Issues and Research Progress of Through Glass Via Technology
MA Xiaohan, DONG Ruipeng, WAN Xin, JIA Fengrui, LONG Xu
电子与封装 . 2025, (7): 70109 .  DOI: 10.16257/j.cnki.1681-1070.2025.0160