GaN HEMT可靠性研究综述

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杨天晴, 邢宗锋, 母欣荣, 赵钢, 文科, 罗俊

Review of Reliability in GaN HEMT

YANG Tianqing, XING Zongfeng, MU Xinrong, ZHAO Gang, WEN Ke, LUO Jun

电子与封装 . 0, (): 0 -0 . DOI: 10.16257/j.cnki.1681-1070.2026.0057