基于JTAG的非完全BS结构的SiP芯片内部互连测试

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华枫, 张秀均, 辛赟龙

Internal Interconnection Testing of SiP Chip with Non-Fully BS Structure Based on JTAG

HUA Feng, ZHANG Xiujun, XIN Yunlong

电子与封装 . 0, (): 0 -0 . DOI: 10.16257/j.cnki.1681-1070.2026.0066