基于深亚微米SOI CMOS器件的极低温特性研究
潘瑜, 常瑞恒, 顾祥, 王印权, 谢儒彬
Research on Cryogenic Temperature Characteristics
of Deep Submicron SOI CMOS Devices
PAN Yu, CHANG Ruiheng, GU Xiang, WANG Yinquan, XIE Rubin
电子与封装
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DOI: 10.16257/j.cnki.1681-1070.2026.0075
