多晶后加氧化对CMOS电路静态电流影响的研究
黄乔娜, 巩家乐, 廖斌彬, 陈诚, 张明
Study on the Effect of Adding Oxidation after Polycrystalline Formation on Static Current of CMOS Circuits
HUANG Qiaona, GONG Jiale, LIAO Binbin, CHEN Cheng, ZHANG Ming
电子与封装
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DOI: 10.16257/j.cnki.1681-1070.2027.0006
