电子元器件测试成本降低技术综述
季伟伟1, 仇钱进1, 张凯虹2, 宋国栋1, 奚留华2, 陆坚1
A
Survey on Cost Reduction Techniques for Electronic Component Testing
JI Weiwei1, QIU Qianjin1, ZHANG Kaihong2, SONG Guodong1, XI Liuhua2, LU Jian1
电子与封装
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0, (): 0
-0
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DOI: 10.16257/j.cnki.1681-1070.2027.0045
