关键词: 测试成本, 测试流程优化, 可测性设计, 在线监测, 预测性维护

Abstract: The continuous increase in the integration level and growing complexity of internal architectures in electronic components pose significant challenges to achieving low-cost, high-efficiency testing. To address existing limitations in mass production testing—such as redundant and cumbersome processes, insufficient design for testability (DFT), and weak capabilities in condition monitoring and fault prediction—this paper focuses on the cost-reduction requirements across the entire lifecycle of component testing. We systematically review cost-reduction technologies from three perspectives: test flow optimization, DFT optimization, and online condition monitoring with predictive maintenance. Furthermore, we evaluate the merits and limitations, applicable scenarios, and future development needs of these technologies. Unlike existing fragmented and isolated studies, this paper constructs a multi-dimensional cost-reduction technology framework. It integrates the coupling relationships and application bottlenecks among various cost-saving techniques, while distilling the development trends and research gaps in this field. Ultimately, this analysis aims to provide low-cost, high-performance technical support and implementation pathways to ensure the operational reliability of electronic equipment throughout its entire lifecycle.

Key words: test cost, test flow optimization, design for testability (DFT), online monitoring, predictive maintenance