压合凹陷造成短路的原因分析及改善*

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李　忠, 麻建华, 李学易

Analysis and Improvement of the Causes of Short Circuit Caused by Compression Depression

ZHANG Hao, YANG Jing, LI Yao

电子与封装 . 2018, (9): 5 -7 . DOI: 10.16257/j.cnki.1681-1070.2018.0094