中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2018, Vol. 18 ›› Issue (9): 5 -7. doi: 10.16257/j.cnki.1681-1070.2018.0094

• 封装、组装与测试 • 上一篇    下一篇

压合凹陷造成短路的原因分析及改善*

李 忠1,麻建华1,李学易2   

  1. 1.广州弘高科技股份有限公司,广州 511470; 2.广东工业大学信息工程学院,广州 510006
  • 收稿日期:2018-05-29 出版日期:2018-09-20 发布日期:2018-09-20

Analysis and Improvement of the Causes of Short Circuit Caused by Compression Depression

LI Zhong1, MA Jianhua1, LI Xueyi2   

  1. 1.Guangzhou Honggao Technology Co., Ltd., Guangzhou 511470, China;2.School of Information Engineering, Guangdong University of Technology, Guangzhou 510006, China
  • Received:2018-05-29 Online:2018-09-20 Published:2018-09-20

摘要: 介绍了对细密线路PCB板一次合格率的改善工作,重点是压合凹陷造成的短路现象的最新研究进展。通过对中测缺陷问题进行分析,发现压合凹陷是重要的中测良率影响因素。对压合凹陷短路现象产生的主要原因(PP粉、纤维丝、涂膜剂及其他灰尘杂物)做了进一步分析,并提出改善办法,可以有效降低压合凹陷造成的短路不良,从而提高中测一次合格率。

Abstract: In this paper, the improvement of the pass rate of PCB board has been introduced, and the key point is to introduce the latest research progress of short- circuit phenomenon caused by compression depression. By analyzing the defects of the intermediate test, it is found that compression depression is an important factor affecting the intermediate test yield. The main reasons (PP powder, fiber wire, coating agent and other dust and debris) for short-circuit caused by compression depression are further analyzed, and the improvement measures are proposed to reduce the short circuit defect caused by compression depression and to improve the passing rate.