40 nm工艺SRAM型FPGA总剂量辐射效应研究
徐玉婷1，孙 静1，郭俊杰2，闫 华1
Total Ionizing Dose Radiation Effects Test and Research of SRAM Type FPGA Based on 40 nm Process
XU Yuting1,SUN Jing1,GUO Junjie2,YAN Hua1
电子与封装
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2017, (12): 42
-44
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DOI: 10.16257/j.cnki.1681-1070.2017.0148
