中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装

• 封装、组装与测试 •    下一篇

微控制器板卡量产阶段失效分析与整改

曾鹏,李金利   

  1. 中科芯集成电路有限公司,江苏 无锡  214072
  • 收稿日期:2025-09-28 修回日期:2025-11-04 出版日期:2025-11-10 发布日期:2025-11-10
  • 通讯作者: 曾鹏

Failure Analysis and Remediation for Microcontroller Boards During Mass Production

ZENG Peng, LI Jinli   

  1. China Key System & Integrated Circuit Co., Ltd., Wuxi 214072, China
  • Received:2025-09-28 Revised:2025-11-04 Online:2025-11-10 Published:2025-11-10

摘要: 针对某微控制器板卡在量产过程中故障率偏高的问题,开展系统性失效分析与工程整改研究。通过电特性测试、去封装后显微观察及生产环境检测等方法,识别出故障主要源于生产线接地隐患、操作不规范及硬件电路防护不足。研究实施了接地系统改造、操作流程标准化与电路防护优化等综合整改措施。经2 500片批量验证,全部通过测试,故障率降至零。结果表明,通过综合改进电气安全、规范操作管理及完善硬件电路设计可有效消除静电放电(ESD)和电气过应力(EOS)风险,显著提升生产良率,对降低电子制造过程中故障率具有重要的工程参考价值。

关键词: 微控制器板卡, 失效分析, ESD/EOS防护, 生产良率

Abstract: To address the high failure rate of a microcontroller board during mass production, a systematic failure analysis and engineering remediation study was conducted. Through electrical characteristic testing, post-de-packaging microscopic inspection, and production environment monitoring, the root causes were identified as production line grounding hazards, non-standardized operations, and inadequate hardware circuit protection. Comprehensive corrective actions were implemented, including grounding system upgrades, standardized operating procedures, and enhanced circuit protection. After batch validation of 2 500 units, all passed testing with the failure rate reduced to zero. Results demonstrate that integrated improvements in electrical safety, standardized operational management, and refined hardware circuit design effectively eliminate electrostatic discharge (ESD) and electrical overstress (EOS) risks, significantly boosting production yield. This approach holds substantial engineering reference value for reducing failure rates in electronic manufacturing processes.

Key words: microcontrollers board, failure analysis, ESD/EOS protection, production yield