关键词: 一次性可编程存储器, 抗辐照加固结构, 表决器

Abstract: A system-level radiation-hardened structure for one-time-programmable memory (OTP) is proposed. In radiation environments, OTP memory is susceptible to single event effects（SEE）, leading to soft errors. To address this, the paper proposes a method of repeatedly reading OTP data and voting on multiple results to detect and correct errors in the read data, thereby significantly enhancing its reliability in radiation environments. The paper simulates the occurrence of soft errors in OTP under radiation conditions and conducts simulation verification of the designed radiation-hardened structure. The simulation results indicate that, employing the system-level reinforcement scheme proposed in this paper, the system can tolerate up to (m-1)/2 soft errors occurring during data reading when performing m (odd number) repeated read operations on OTP, without exerting any influence on the accuracy of the final data output. The radiation-hardened structure designed in the paper has a simple hardware implementation method and occupies a small area.

Key words: one-time-programmable memory, radiation-hardened structure, voting machine module