关键词: 双腔结构, 下层腔体, PIND, 信号传递效率

Abstract: Due to the recessed position of the lower cavity within the overall structure of dual-cavity devices, conventional PIND detection methods cannot directly yield accurate results. Inadequate detection of foreign objects may lead to product short circuits or even burnout. This paper investigates the optimal PIND detection method for the lower cavity of dual-cavity devices. A test fixture with an integrated protrusion structure was designed and employed for PIND testing on typical foreign objects. Comparisons were conducted against methods using pure aluminum spacers, silicone gel, ceramic surface testing, and direct metal frame testing. Results indicate that while minor signal loss occurs during detection of the lower cavity in ceramic devices with dual-cavity structures, the custom fixture method remains the most sensitive detection approach among the five evaluated techniques.

Key words: dual-chamber structures, lower cavity,  PIND, signal transmission efficiency