电子与封装
• 封装、组装与测试 • 下一篇
郑天池，宋林峰，季振凯
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ZHENG Tianchi, SONG Linfeng, JI Zhenkai
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摘要： SRAM型现场可编程门阵列（FPGA）作为现代航天电子系统的核心组件，易受空间粒子影响产生单粒子效应。空间环境下若发生单粒子闩锁（SEL），极易造成系统崩溃，对整个航天系统造成不可逆的影响。基于不同特征尺寸FPGA设计了一套单粒子效应测试系统，该系统采用子母板分离的方式，兼容不同工艺水平FPGA的单粒子效应测试。基于该测试系统，可以纵向对比研究相同辐照环境下，不同工艺水平FPGA的单粒子闩锁特性。实验结果证明了FPGA的特征尺寸越小，越容易发生SEL的结论。
关键词: 单粒子闩锁, FPGA, 特征尺寸, 辐照实验
Abstract:
SRAM-based Field Programmable Gate Arrays (FPGAs), serving as core component in modern aerospace electronic systems, are susceptible to single-event effects caused by space particles. In the space environment, the occurrence of a single-event latch-up (SEL) can easily lead to system crashes and cause irreversible impacts on the entire aerospace system. Based on FPGAs with different feature sizes, this paper designs a single-event effect test system. The system adopts a modular motherboard-daughterboard architecture and is compatible with single-event effect testing for FPGAs of varying process technologies. Based on the test system, a longitudinal comparative study was conducted on the single-event latch-up characteristics of FPGAs with different process levels under identical irradiation conditions. The results demonstrate that FPGAs with smaller feature sizes are more susceptible to SEL.
Key words: single-event latch-up, FPGA, feature size, irradiation test
郑天池, 宋林峰, 季振凯. 不同特征尺寸FPGA单粒子闩锁测试改良方法[J]. 电子与封装, doi: 10.16257/j.cnki.1681-1070.2026.0128.
ZHENG Tianchi, SONG Linfeng, JI Zhenkai. Improved Method for Single Event Latch-up Testing of FPGAs with Different Feature Sizes[J]. Electronics & Packaging, doi: 10.16257/j.cnki.1681-1070.2026.0128.
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链接本文: https://ep.org.cn/CN/10.16257/j.cnki.1681-1070.2026.0128
