关键词: 抗辐照加固, 三模冗余, 接口电路

Abstract: Integrated circuits operating in radiation environments for aerospace applications are susceptible to single-event effects, which can compromise system reliability. In the integrated circuit design phase, triple modular redundancy (TMR) is commonly adopted for radiation-hardened design. However, existing TMR-based radiation-hardened designs require customized front-end circuit design, which suffers from poor compatibility with general design flows and low design efficiency. This paper presents a radiation hardening method that implements triple modular redundancy by processing front-end gate-level netlists with an automated tool. Test results show that with an area overhead of 241%, the hardened circuit achieves a single-event upset (SEU) error rate lower than 1×10^-10 error/(bit·day), and its single-event latch up (SEL) threshold exceeds 75 MeV·cm²/mg. The proposed method fully meets the application requirements of radiation-hardened interface circuits.

Key words: radiation-hardening, triple modular redundancy, interface circuit