中国电子学会电子制造与封装技术分会会刊

中国半导体行业协会封测分会会刊

无锡市集成电路学会会刊

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电子与封装

• 封装、组装与测试 •    下一篇

金凸点的植球过程及其形貌影响因素分析

易双秦,朱晨俊,张未希,常文涵,张家明   

  1. 中国电子科技集团公司第二十九研究所,成都  610036
  • 收稿日期:2026-05-31 修回日期:2026-07-29 出版日期:2026-08-04 发布日期:2026-08-04
  • 通讯作者: 易双秦

Analysis on Ball Bonding Process and Morphology Influencing Factors of Gold Bumps

YI Shuangqin, ZHU Chenjun, ZHANG Weixi, CHANG Wenhan, ZHANG Jiaming   

  1. China Electronics Technology Group Corporation No. 43 Research Institute, Chengdu 610036, China
  • Received:2026-05-31 Revised:2026-07-29 Online:2026-08-04 Published:2026-08-04

摘要: 金凸点是倒装芯片键合的关键互连结构,其形貌直接影响芯片互连可靠性。为实现金凸点的形貌调控,系统研究了工艺参数对金凸点的植球过程及形貌的影响规律。基于植球成型原理分析金凸点的成型过程,采用控制变量法开展工艺试验,结合线性拟合方法,探究打火参数及焊接参数(焊接压力、超声功率、超声时间)对金凸点体积与形状的影响规律。研究结果表明,金凸点体积与打火参数呈正相关;焊接参数与凸点形状尺寸呈线性关联,其中焊接压力、超声功率为主要影响因素,超声时间影响相对微弱。根据金凸点形貌变化趋势确定了关键工艺参数的合理取值范围。通过多元线性拟合建立了形状尺寸的计算公式。试验验证表明,拟合公式误差较小、在设定参数范围内适用性良好,可为倒装芯片金凸点成型工艺的参数优化与形貌调控提供理论参考。

关键词: 金凸点, 打火参数, 焊接压力, 超声功率, 超声时间

Abstract: Gold bumps are critical interconnection structures for flip chip bonding, and their morphology directly affects chip interconnection reliability. To achieve gold bump morphology control, this study systematically investigates the effects of process parameters on the gold bump ball bonding process and morphology. The gold bump forming mechanism is analyzed based on ball bonding principles. Process experiments are conducted using the control variable method, and linear fitting is adopted to explore the influences of ignition parameters and bonding parameters (bonding pressure, ultrasonic power, ultrasonic time) on gold bump volume and shape. The results show that gold bump volume is positively correlated with ignition parameters. Bonding parameters are linearly correlated with bump shape and dimensions. Bonding pressure and ultrasonic power are the dominant influencing factors, while ultrasonic time has a relatively weak effect. Reasonable value ranges of key process parameters are determined based on gold bump morphology variation. Dimensional fitting formulas are established via multiple linear fitting. Experimental verification proves the formulas have small errors and good applicability within the set parameter range. This work provides theoretical support for parameter optimization and morphology control of flip-chip gold bump forming processes.

Key words: gold bumps, ignition parameters, bonding pressure, ultrasonic power, ultrasonic time