关键词: 老炼, FPGA, 多程序, 覆盖率

Abstract: The burn-in test can accelerate the aging of FPGA and make the FPGA quickly enter the occasional failure period with low failure rate and stability. It is an important method to eliminate potential defective FPGA circuits. However, as the scale of FPGA becomes larger and larger, the traditional single-segment program dynamic aging cannot realize the logic flip of most of the FPGA resources, and the potential defects of the circuit cannot be exposed in time, which may cause the abnormal flow of the defective circuit. Aiming at the limitation of single-segment program dynamic burn-in, a multi-program dynamic burn-in hardware system that can write multiple burn-in programs cyclically is designed. At the same time, FPGA burn-in program is developed for this burn-in system, which significantly improves FPGA burn-in coverage.

Key words: burn-in, FPGA, multi-program, coverage