关键词: 反熔丝FPGA, 可配置I/O, 可测性设计

Abstract: For screening, antifuse FPGA cannot be programmed at the production stage. The way of testing before programming must be adopted. Based on the research of the structure of multi-standardconfigurable I/O of antifuse FPGA, a design for testability (DFT) for the I/O is proposed. By inserting soft-configured circuit and boundary scan chain into configurable I/O circuit, the DFT can achieve the purpose of temporary configuration and scanning test. All supported I/O standards and other configurable functions are covered. The simulation and test results show that the DFT can satisfy the testing demands of multi-standardconfigurable I/O interfaces and solve the problem of I/O testing for antifuse FPGA at the production stage.

Key words: antifuse FPGA, configurable I/O, DFT