中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2023, Vol. 23 ›› Issue (9): 090203 . doi: 10.16257/j.cnki.1681-1070.2023.0116

• 封装、组装与测试 • 上一篇    下一篇

一种用于CPLD擦写寿命验证的设计

顾小明,肖培磊,唐勇   

  1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214035
  • 收稿日期:2023-02-15 出版日期:2023-09-25 发布日期:2023-09-25
  • 作者简介:顾小明(1982—),男,江苏盐城人,硕士,高级工程师,主要研究方向为模拟电路测试应用及嵌入式系统设计。

Design for CPLD Program/Erase Cycles Verification

GU Xiaoming,XIAO Peilei,TANG Yong   

  1. China Electronics Technology Group Corporation No.58 Research Institute,Wuxi 214035, China
  • Received:2023-02-15 Online:2023-09-25 Published:2023-09-25

摘要: 近年来,国防等应用领域对电子元器件提出了国产化要求,自主设计的高性能复杂可编程逻辑器件(CPLD)应运而生。这些CPLD需要按照一定的标准流程进行筛选、考核,其中擦写寿命是一项重要的考核指标。阐述了采用集成开发环境及自动化测试机台对CPLD擦写寿命进行验证的不足之处,提出了一种CPLD擦写寿命验证装置的设计,经过实际检验,设计的装置稳定可靠,满足大批量器件的验证需求,提高了CPLD擦写寿命验证的效率。

关键词: JTAG接口, 配置码格式, 多工位, 并行工作

Abstract: In recent years, domestic requirements have been put forward for electronic components in application fields such as national defense, and high-performance complex programmable logic devices(CPLDs) designed independently have emerged. These CPLDs need to be tested and selected according to a certain standard process, with program/erase cycles being an important assessment indicator. The shortcomings of usingintegrated development environment and automated testing machine to verify the CPLD program/erase cyclesare described, and a design of CPLD program/erase cycles verification device is proposed. After practical testing, the designed device is stable and reliable, meeting the verification requirements of a large number of devices,and greatly improving the efficiency of CPLD program/erase cycles verification.

Key words: JTAG interface, programming code format, multiple test sites, parallel working

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